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Volumn 85, Issue 1, 2002, Pages 276-278
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Control of microstructures in α-SiAION ceramics
a a a a b,c a |
Author keywords
[No Author keywords available]
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Indexed keywords
ASPECT RATIO;
DOPING (ADDITIVES);
ENERGY DISPERSIVE SPECTROSCOPY;
METALLOGRAPHIC MICROSTRUCTURE;
SCANNING ELECTRON MICROSCOPY;
SILICON COMPOUNDS;
SINTERING;
X RAY DIFFRACTION ANALYSIS;
GAS-PRESSURE SINTERING (GPS);
PRESSURELESS SINTERING (PLS);
CERAMIC MATERIALS;
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EID: 0036349531
PISSN: 00027820
EISSN: None
Source Type: Journal
DOI: 10.1111/j.1151-2916.2002.tb00082.x Document Type: Conference Paper |
Times cited : (12)
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References (14)
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