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Volumn 711, Issue , 2002, Pages 25-30

Surface characterization of DNA microarray on silicon dioxide and compatible silicon materials in the immobilization process

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ANGLE MEASUREMENT; ATOMIC FORCE MICROSCOPY; CHEMICAL BONDS; CONTACT ANGLE; GROWTH (MATERIALS); ORGANIC COMPOUNDS; PARTICLE SIZE ANALYSIS; PASSIVATION; SILICA; SILICON NITRIDE; SURFACE PROPERTIES;

EID: 0036343412     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (4)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.