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Volumn 711, Issue , 2002, Pages 25-30
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Surface characterization of DNA microarray on silicon dioxide and compatible silicon materials in the immobilization process
a a a a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM;
ANGLE MEASUREMENT;
ATOMIC FORCE MICROSCOPY;
CHEMICAL BONDS;
CONTACT ANGLE;
GROWTH (MATERIALS);
ORGANIC COMPOUNDS;
PARTICLE SIZE ANALYSIS;
PASSIVATION;
SILICA;
SILICON NITRIDE;
SURFACE PROPERTIES;
CONTACT ANGLE MEASUREMENT;
FLUORESCENCE MICROSCOPY;
HYBRIDIZATION;
IMMOBILIZATION;
MERCAPTOPROPYL TRIMETHOXYSILANE;
OLIGONUCLEOTIDES;
DNA;
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EID: 0036343412
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (2)
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References (4)
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