Large area operational wheat yield model development and validation based on spectral and meteorological data

International Journal of Remote Sensing

Volumn 23, Issue 15, 2002, Pages 3023-3038

  Manjunath, K R ^a   Potdar, M B ^a   Purohit, N L ^a  

^a INDIAN SPACE RESEARCH ORGANISATION   (India)

Author keywords

[No Author keywords available]

Indexed keywords

AGRICULTURE; CLIMATE CHANGE; CROPS; METEOROLOGY; RAIN; REGRESSION ANALYSIS; SATELLITES; VEGETATION;

CROP CUTTING EXPERIMENTS (CCE);

REMOTE SENSING;

AVHRR; CROP YIELD; NDVI; NOAA SATELLITE; WHEAT;

EID: 0036326469     PISSN: 01431161     EISSN: None     Source Type: Journal    
DOI: 10.1080/01431160110104692     Document Type: Article

References (10)

1. The use of large area spectral data in wheat yield estimation
2. Large area relation of Landsat MSS and NOAA-6 AVHRR spectral data to wheat yield
3. Estimation of crop grain yield by remote sensing of crop senescence rates
4. Estimation of rice yield using IRS IA digital data in coastal tract of Orissa
5. Sorghum yield modelling based on crop growth parameters determined from visible and near-[R channel NOAA AVHRR data
6. Spectrometeorological modeling of sorghum yield using single date IRS LISS-1 and rainfall distribution data
7. Multi-season atmospheric normalization of NOAA AVHRR derived NDVI for crop yield modeling
8. Seasonal visible, near infrared and middle infrared spectra of rice canopies in relation to LAI and above ground phytomass
9. Leaf area, light interception and yield estimation from spectral component analysis