X-ray diffraction measurement below 1 K

Journal of Low Temperature Physics

Volumn 128, Issue 1-2, 2002, Pages 1-7

  Suzuki, H ^a   Naher, S ^a   Shimoguchi, T ^a   Mizuno, M ^a   Ryu, A ^a   Fujishita, H ^a  

^a KANAZAWA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COOLING; DIFFRACTOMETERS; GONIOMETERS; HELIUM; POWDERS; REFRIGERATORS; X RAY DIFFRACTION;

INTENSITIES;

THULIUM COMPOUNDS;

DIFFRACTION; POWDER; X-RAY TECHNIQUE;

EID: 0036311918     PISSN: 00222291     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1015729021796     Document Type: Article

References (8)