Parametric dependencies for photoacoustic leak localization

Journal of the Acoustical Society of America

Volumn 112, Issue 1, 2002, Pages 145-155

  Yönak, Serdar H ^a   Dowling, David R ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; FREQUENCIES; LASER BEAMS; LEAK DETECTION; MICROPHONES;

SCAN RATES;

PHOTOACOUSTIC EFFECT;

SULFUR HEXAFLUORIDE;

ACOUSTIC TECHNIQUE; COMPONENT; LASER; LEAK DETECTION; MANUFACTURING SYSTEM; TRACER;

ACOUSTICS; ANALYTIC METHOD; ARTICLE; CARBON DIOXIDE LASER; MATERIALS MANAGEMENT; MOLECULAR MODEL; PARAMETRIC TEST; PRIORITY JOURNAL; QUALITY CONTROL; SIGNAL PROCESSING;

EID: 0036303788     PISSN: 00014966     EISSN: None     Source Type: Journal    
DOI: 10.1121/1.1487838     Document Type: Article

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