Field evaporation behaviour in the γ phase in Ti-Al during analysis in the tomographic atom probe

Ultramicroscopy

Volumn 92, Issue 2, 2002, Pages 77-87

  Lefebvre, W ^a   Loiseau, A ^b   Menand, A ^a  

^a UNIVERSITÉ DE ROUEN   (France)

^b Centre National de la Recherche Scientifique   (France)

Author keywords

3D atom probe; Atom probe; Chemical order; Field ion microscopy; Interface; Intermetallics; Lamellar structure; TiAl

Indexed keywords

ALUMINUM ALLOYS; EVAPORATION; HEAT TREATMENT; TITANIUM; TOMOGRAPHY;

SUPERLATTICE PLANES;

TRANSMISSION ELECTRON MICROSCOPY;

ALUMINUM; TITANIUM;

ARTICLE; ATOM; ELECTRON MICROSCOPY; EVAPORATION; HEAT TREATMENT; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0036296321     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(02)00070-0     Document Type: Article

References (28)

1. The Science, Technology and Applications of Titanium