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Volumn , Issue , 2002, Pages 1114-1118

MPM BGA package

Author keywords

[No Author keywords available]

Indexed keywords

CHIP SCALE PACKAGES; DIES; EMBEDDED SYSTEMS; INTEGRATED CIRCUIT TESTING; INTEGRATED CIRCUITS; RELIABILITY; SOLDERED JOINTS;

EID: 0036294774     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (2)
  • 2
    • 0009553202 scopus 로고    scopus 로고
    • Amkor Presentation, Private


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.