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Volumn 4, Issue , 2002, Pages

Voltage-clamped class E amplifier with a Zener diode across the switch

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN FOR TESTABILITY; ELECTRIC BREAKDOWN; ELECTRIC LOSSES; ELECTRIC NETWORK ANALYSIS; ELECTRIC POTENTIAL; ELECTRIC SWITCHES; ZENER DIODES; ZENER EFFECT;

EID: 0036294672     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (13)

References (2)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.