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Volumn 5, Issue , 2002, Pages

Practical issues using e-pot circuits

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENTIAL AMPLIFIERS; ELECTRON TUNNELING; GATES (TRANSISTOR); NONVOLATILE STORAGE; POTENTIOMETERS (ELECTRIC MEASURING INSTRUMENTS); VOLTAGE CONTROL;

EID: 0036293228     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (3)

References (2)
  • 2
    • 39049091552 scopus 로고    scopus 로고
    • The hot-carrier effect
    • edited by C. Y. Chang and S.M. Sze, John Wiley and Sons, Inc., New York
    • (2000) ULSI Devices , pp. 275-332
    • Doyle, B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.