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Journal of Materials Research

Volumn 17, Issue 1, 2002, Pages 31-35

Tb L3-edge x-ray absorption near-edge structure spectroscopic analysis of terbium-doped phosphor compounds for plasma display panel applications

(4) Choi, Yong Gyu a Sohn, Kee Sun b Kim, Kyong Hon a Park, Hee Dong c

a Electronics and Telecommunications Research Institute (ETRI) (South Korea)

b Sunchon National University (South Korea)

c Korea Research Institute of Chemical Technology (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

DOPING (ADDITIVES); ENERGY TRANSFER; FLUORESCENCE; PLASMA DISPLAY DEVICES; QUENCHING; SPECTROSCOPIC ANALYSIS; TERBIUM; X RAY ANALYSIS;

PHOSPHOR COMPOUNDS;

PHOSPHORS;

EID: 0036262307 PISSN: 08842914 EISSN: None Source Type: Journal
DOI: 10.1557/JMR.2002.0007 Document Type: Article

Times cited : (19)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.