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Volumn 51, Issue 2, 2002, Pages 169-177
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Improvement of the accuracy by the measurement of the electrical cell membrane parameters
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Author keywords
Access resistance; Dual frequency method; Electrical parameters of the cell membrane; Exocytosis; Membrane capacity; Membrane conductance; Patch clamp technique
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Indexed keywords
ACCURACY;
ARTICLE;
CELL MEMBRANE;
CELL MEMBRANE CONDUCTANCE;
CELL MEMBRANE RESISTANCE;
COMPUTER MODEL;
COMPUTER PROGRAM;
ELECTRIC CURRENT;
ELECTRIC POTENTIAL;
ELECTROPHYSIOLOGY;
FEEDBACK SYSTEM;
TRANSDUCER;
CELL MEMBRANE;
ELECTRIC CONDUCTIVITY;
ELECTRIC IMPEDANCE;
EXOCYTOSIS;
MODELS, BIOLOGICAL;
PATCH-CLAMP TECHNIQUES;
REPRODUCIBILITY OF RESULTS;
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EID: 0036255440
PISSN: 08628408
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (2)
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References (18)
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