Nondestructive characterization of planar defects using laser-generated ultrasonic shear waves

Research in Nondestructive Evaluation

Volumn 13, Issue 4, 2001, Pages 215-230

  Wooh, S C ^a   Wang, J Y ^a  

^a Massachusetts Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; PULSED LASER APPLICATIONS; SHEAR WAVES; ULTRASONIC WAVES; WAVE PROPAGATION;

PLANAR DEFECTS;

NONDESTRUCTIVE EXAMINATION;

EID: 0036244838     PISSN: 09349847     EISSN: 14322110     Source Type: Journal    
DOI: 10.1080/09349840109409699     Document Type: Article

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