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Volumn 30, Issue 1, 2002, Pages 149-165
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A controlled deterioration test for Arabidopsis thaliana reveals genetic variation in seed quality
a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ARABIDOPSIS THALIANA;
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EID: 0036240417
PISSN: 02510952
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (68)
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References (42)
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