A method for reducing the effects of random mismatch in CMOS bandgap references

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn , Issue SUPPL., 2002, Pages 318-319+525

  Ceekala, Vijaya G ^a   Lewicki, Lawrence D ^a   Wieser, James B ^a   Varadarajan, Devnath ^a   Mohan, Jitendra ^a  

^a NATIONAL SEMICONDUCTOR CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC INDUCTORS; ENERGY GAP; OPERATIONAL AMPLIFIERS; SIGNAL PROCESSING; TRANSMITTERS; VOLTAGE DISTRIBUTION MEASUREMENT;

CURRENT-MIRROR OFFSETS; INPUT-REFERRED OFFSETS;

CMOS INTEGRATED CIRCUITS;

EID: 0036224873     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)