A 4 GSample/s 8 b ADC in 0.35 μm CMOS

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn , Issue SUPPL., 2002, Pages 126-127+432

  Poulton, Ken ^a   Neff, Robert ^a   Muto, Art ^a   Liu, Wei ^a   Burstein, Andy ^a   Heshami, Mehrdad ^a  

^a AGILENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; CMOS INTEGRATED CIRCUITS; DIGITAL CIRCUITS; ELECTRIC CLOCKS; ERROR ANALYSIS;

INTERLEAVED CLOCKS;

ANALOG TO DIGITAL CONVERSION;

EID: 0036224665     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)