Nonlinear programming applied to calibrating thermal and fluid models to test data

Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Volumn , Issue , 2002, Pages 77-82

  Baumann, Jane ^a   Cullimore, Brent ^a  

^a C R Technologies   (United States)

Author keywords

Calibration; Correlation; Design automation; Optimization; Parametric modeling; Thermal analysis; Validation

Indexed keywords

CALIBRATION; CAPACITANCE; CORRELATION METHODS; CURVE FITTING; ELECTRIC CONDUCTANCE; MATHEMATICAL MODELS; NONLINEAR PROGRAMMING; OPTIMIZATION; THERMOANALYSIS;

CONTACT RESISTANCES; THERMAL MODELING;

ELECTRONIC EQUIPMENT;

EID: 0036218288     PISSN: 10652221     EISSN: None     Source Type: Journal    
DOI: 10.1109/STHERM.2002.991349     Document Type: Article

References (2)

1. Dealing with uncertainties and variations in thermal design