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Volumn 82, Issue 4, 2002, Pages 1930-1942
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Applying hidden Markov models to the analysis of single ion channel activity
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Author keywords
[No Author keywords available]
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Indexed keywords
ARTICLE;
CHANNEL GATING;
ION CURRENT;
MODEL;
PATCH CLAMP;
SIGNAL NOISE RATIO;
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EID: 0036213026
PISSN: 00063495
EISSN: None
Source Type: Journal
DOI: 10.1016/S0006-3495(02)75542-2 Document Type: Article |
Times cited : (89)
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References (28)
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