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Volumn 63, Issue 2, 2002, Pages 146-151
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Effect of additives on the microstructure and thermal properties of a mica-based glass-ceramic
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM COMPOUNDS;
CALCIUM COMPOUNDS;
COMPOSITION;
CRACK PROPAGATION;
CRYSTAL GROWTH;
CRYSTAL MICROSTRUCTURE;
CRYSTALLIZATION;
DIFFERENTIAL THERMAL ANALYSIS;
GLASS CERAMICS;
GLASS TRANSITION;
INGOTS;
LITHIUM COMPOUNDS;
MICA;
NUCLEATION;
SCANNING ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
CRYSTALLINE PHASES;
DENTAL MATERIALS;
CALCIUM FLUORIDE;
DRUG ADDITIVE;
FLUORINE;
GLASS;
LITHIUM;
MAGNESIUM OXIDE;
MICA;
OXYGEN DERIVATIVE;
POTASSIUM DERIVATIVE;
SILICON DIOXIDE;
ALUMINUM DERIVATIVE;
ALUMINUM PHOSPHATE;
ALUMINUM SILICATE;
PHOSPHATE;
ARTICLE;
CALCULATION;
CERAMICS;
CHEMICAL COMPOSITION;
COMPLIANCE (PHYSICAL);
CRYSTAL STRUCTURE;
CRYSTALLIZATION;
DIFFERENTIAL SCANNING CALORIMETRY;
DOSE TIME EFFECT RELATION;
GLASS TRANSITION TEMPERATURE;
HIGH TEMPERATURE PROCEDURES;
MELTING POINT;
PARTICLE SIZE;
PHASE SEPARATION;
SCANNING ELECTRON MICROSCOPY;
STEREOLOGY;
STRUCTURE ANALYSIS;
TEMPERATURE DEPENDENCE;
THERMAL ANALYSIS;
TOOTH PROSTHESIS;
X RAY DIFFRACTION;
CHEMISTRY;
DENTURE;
MATERIALS TESTING;
STANDARD;
ALUMINUM COMPOUNDS;
ALUMINUM SILICATES;
CALCIUM FLUORIDE;
CERAMICS;
CRYSTALLIZATION;
DENTAL VENEERS;
DIFFERENTIAL THERMAL ANALYSIS;
GLASS;
LITHIUM;
MATERIALS TESTING;
MICROSCOPY, ELECTRON, SCANNING;
PHOSPHATES;
X-RAY DIFFRACTION;
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EID: 0036209560
PISSN: 00219304
EISSN: None
Source Type: Journal
DOI: 10.1002/jbm.10122 Document Type: Article |
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Times cited : (8)
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References (10)
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