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Volumn 21, Issue 1, 2002, Pages 23-31
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An analysis of wire-load model uncertainty problem
a
IEEE
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Author keywords
ASIC; CMOS; DSM; Interconnect estimation; Physical design; Wireload capacitance
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Indexed keywords
APPLICATION SPECIFIC INTEGRATED CIRCUITS;
CAPACITANCE;
CMOS INTEGRATED CIRCUITS;
DELAY CIRCUITS;
ELECTRIC WIRE;
LOGIC DESIGN;
LOGIC GATES;
STATISTICAL METHODS;
LOGIC SYNTHESIS;
INTEGRATED CIRCUIT LAYOUT;
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EID: 0036182550
PISSN: 02780070
EISSN: None
Source Type: Journal
DOI: 10.1109/43.974134 Document Type: Article |
Times cited : (6)
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References (13)
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