BER estimation for all-optical regenerators influenced by pattern effects

IEEE Photonics Technology Letters

Volumn 14, Issue 1, 2002, Pages 33-35

  Bischoff, Svend ^a   Lading, Brian ^a   Mørk, Jesper ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

All optical regeneration; Optical communications; Semiconductor optical amplifiers

Indexed keywords

BIT ERROR RATE; FIBER LASERS; FREQUENCY CONVERTERS; GAUSSIAN NOISE (ELECTRONIC); INTERFEROMETERS; MATHEMATICAL MODELS; OPTICAL LINKS; PROBABILITY DENSITY FUNCTION; SEMICONDUCTOR LASERS; SIGNAL INTERFERENCE; SPURIOUS SIGNAL NOISE; TRANSFER FUNCTIONS;

ALL OPTICAL REGENERATION; BIT ERROR ESTIMATION; ERBIUM DOPED FIBER AMPLIFIERS; PATTERN EFFECTS; SEMICONDUCTOR OPTICAL AMPLIFIERS; WAVELENGTH CONVERTERS;

OPTICAL COMMUNICATION;

EID: 0036180888     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/68.974152     Document Type: Article

References (7)

1. All-optical wavelength conversion by semiconductor optical amplifiers
2. Recirculating loop demonstration of 40 Gbit/s all-optical 3R regeneration using a semiconductor nonlinear interferometer
3. Simultaneously regenerated 4 × 40 Gbit/s dense WDM transmission over 10 000 km using single 40 Ghz InP Mach-Zehnder modulator
4. Noise accumulation and BER estimates in concatenated nonlinear optoelectronic repeaters
5. 3.8-THz wavelength conversion of picosecond pulses using a semiconductor delayed interference signal-wavelength converter (DISC)
6. 100 Gbit/s all-optical wavelength conversion with integrated SOA delayed-interference configuration
7. Bi-directional four wave mixing in semiconductor optical amplifiers: Theory and experiment