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Volumn 67, Issue 1, 2002, Pages 15-35
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Emanation thermal analysis. Ready to fulfill the future needs of materials characterization
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Author keywords
Emanation thermal analysis; Microstructure; Sintering; Solid state transitions; Surface roughness annealing
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Indexed keywords
ANNEALING;
CRYSTAL MICROSTRUCTURE;
ELECTRON MICROSCOPY;
HEATING;
INERT GASES;
MORPHOLOGY;
NANOSTRUCTURED MATERIALS;
PHASE TRANSITIONS;
SINTERING;
SURFACE ROUGHNESS;
SURFACE STRUCTURE;
X RAY DIFFRACTION ANALYSIS;
EMANATION THERMAL ANALYSIS;
SURFACE AREA;
THERMOANALYSIS;
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EID: 0036176644
PISSN: 14182874
EISSN: None
Source Type: Journal
DOI: 10.1023/A:1013783001631 Document Type: Article |
Times cited : (39)
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References (72)
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