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Volumn 67, Issue 1, 2002, Pages 15-35

Emanation thermal analysis. Ready to fulfill the future needs of materials characterization

Author keywords

Emanation thermal analysis; Microstructure; Sintering; Solid state transitions; Surface roughness annealing

Indexed keywords

ANNEALING; CRYSTAL MICROSTRUCTURE; ELECTRON MICROSCOPY; HEATING; INERT GASES; MORPHOLOGY; NANOSTRUCTURED MATERIALS; PHASE TRANSITIONS; SINTERING; SURFACE ROUGHNESS; SURFACE STRUCTURE; X RAY DIFFRACTION ANALYSIS;

EID: 0036176644     PISSN: 14182874     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1013783001631     Document Type: Article
Times cited : (39)

References (72)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.