Mechanisms for pitting corrosion in alloy N04400 as revealed by imaging XPS, ToF-SIMS and low-voltage SEM

Surface and Interface Analysis

Volumn 33, Issue 1, 2002, Pages 29-34

  Ramamurthy, S ^a   Davidson, R D ^a   McIntyre, N S ^a   Francis, J T ^a   McBride, A ^b   Brennenstuhl A M ^b   Roberts, A ^c  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

^b KINECTRICS INC   (Canada)

^c Kratos Analytical Ltd   (United Kingdom)

Author keywords

Inconel; Pitting corrosion; SEM; ToF SIMS; XPS

Indexed keywords

ANODIC PROTECTION; AUGER ELECTRON SPECTROSCOPY; CATHODIC PROTECTION; DISSOLUTION; ELECTROCHEMISTRY; ENERGY DISPERSIVE SPECTROSCOPY; PITTING; SECONDARY ION MASS SPECTROMETRY; SURFACE CHEMISTRY; X RAY PHOTOELECTRON SPECTROSCOPY;

CORROSION PITS; ENERGY DISPERSIVE X RAY IMAGING; IMAGING X RAY PHOTOELECTRON SPECTROSCOPY; LOW VOLTAGE SCANNING ELECTRON MICROSCOPY; NICKEL COPPER ALLOY; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY;

NICKEL ALLOYS;

EID: 0036169053     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1157     Document Type: Article

References (3)