Determination of coating thickness of DEHS on submicron particles by means of low pressure impaction

Chemical Engineering and Technology

Volumn 25, Issue 1, 2002, Pages 77-82

  Seipenbusch, M ^a   Heel, A ^a   Weber, A P ^a   Kasper, G ^a  

^a UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AGGLOMERATION; CORRELATION METHODS; NANOSTRUCTURED MATERIALS; PRESSURE EFFECTS; SENSITIVITY ANALYSIS;

COATING THICKNESS;

CHEMICAL ENGINEERING;

COATING; IMPACT; LOW PRESSURE; MEASUREMENT METHOD;

EID: 0036167919     PISSN: 09307516     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-4125(200201)25:1<77::AID-CEAT77>3.0.CO;2-B     Document Type: Article

References (7)