Lock-in imaging of multicycle integration focal plane array

Review of Scientific Instruments

Volumn 73, Issue 1, 2002, Pages 11-

  Chin, Ken K ^a   Ou, Haijiang ^a  

^a NEW JERSEY INSTITUTE OF TECHNOLOGY   (United States)

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[No Author keywords available]

Indexed keywords

EID: 0036149773     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1426232     Document Type: Article

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