Applications of artificial neural networks to RF and microwave measurements

International Journal of RF and Microwave Computer-Aided Engineering

Volumn 12, Issue 1, 2002, Pages 3-24

  Jargon, Jeffrey A ^a   Gupta, K C ^b   DeGroot, Donald C ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b UNIVERSITY OF COLORADO   (United States)

Author keywords

Application; Artificial neural network; Calibration; Measurement; Microwave; Model; Network analyzer; Standards

Indexed keywords

CALIBRATION; ELECTRIC NETWORK ANALYSIS; MATHEMATICAL MODELS; NEURAL NETWORKS; PERMITTIVITY MEASUREMENT; STANDARDS; VECTORS;

VECTORK NETWORK ANALYSIS (VNA);

MICROWAVE MEASUREMENT;

EID: 0036135658     PISSN: 10964290     EISSN: None     Source Type: Journal    
DOI: 10.1002/mmce.10014     Document Type: Article

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