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Vacuum

Volumn 64, Issue 3-4, 2002, Pages 431-437

Characterization of a barium surface by AES, XPS and SIMS

(2) Teodoro, O M N D a Moutinho, A M C a

a UNIVERSIDADE NOVA DE LISBOA (Portugal)

Author keywords

AES; Barium; SIMS; XPS

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; BARIUM; IMPURITIES; IONS; SECONDARY ION MASS SPECTROMETRY; SPECTRUM ANALYSIS; SPUTTERING; SURFACE STRUCTURE; X RAY PHOTOELECTRON SPECTROSCOPY;

SURFACE ANALYSIS;

SURFACE CLEANING;

EID: 0036134740 PISSN: 0042207X EISSN: None Source Type: Journal
DOI: 10.1016/S0042-207X(01)00344-X Document Type: Article

Times cited : (1)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.