Carrier lifetime and turn-off current control by electron irradiation of MCT

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 186, Issue 1-4, 2002, Pages 157-160

  Chernyavsky, E V ^a   Popov, V P ^a   Krasnikov, Yu I ^a   Safronov, L N ^a  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Russian Federation)

Author keywords

Carrier lifetime; Energy losses; Irradiation; MCT

Indexed keywords

CURRENT DENSITY; ELECTRON IRRADIATION; ELECTRONICS PACKAGING; MOS DEVICES; PROTON IRRADIATION; THERMODYNAMIC STABILITY;

CARRIER LIFETIME; METAL OXIDE SEMICONDUCTOR CONTROLLED THYRISTORS (MCT);

THYRISTORS;

EID: 0036134729     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)00948-X     Document Type: Article

References (7)