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Volumn 42, Issue 1, 2002, Pages 93-100
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Characterization of solder interfaces using laser flash metrology
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Author keywords
[No Author keywords available]
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Indexed keywords
HEAT RESISTANCE;
MEASUREMENTS;
SANDWICH STRUCTURES;
THERMAL CONDUCTIVITY;
LASER FLASH METROLOGY;
SOLDER VOIDING;
MICROELECTRONICS;
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EID: 0036133317
PISSN: 00262714
EISSN: None
Source Type: Journal
DOI: 10.1016/S0026-2714(01)00129-9 Document Type: Article |
Times cited : (41)
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References (6)
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