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Volumn 42, Issue 1, 2002, Pages 93-100

Characterization of solder interfaces using laser flash metrology

Author keywords

[No Author keywords available]

Indexed keywords

HEAT RESISTANCE; MEASUREMENTS; SANDWICH STRUCTURES; THERMAL CONDUCTIVITY;

EID: 0036133317     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(01)00129-9     Document Type: Article
Times cited : (41)

References (6)
  • 5
    • 2142681463 scopus 로고
    • Pulse method of measuring thermal diffusivity at high temperatures
    • (1963) J Appl Phys , vol.34 , Issue.4 , pp. 926-927
    • Cowan, R.D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.