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Volumn 234, Issue 2-3, 2002, Pages 589-598
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Pyramids on {1 0 0} NaCl after formamide etching
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Author keywords
Al. Atomic force microscopy; Al. Etching; Al. Optical microscopy; Al. Surface structure; Bl. Sodium chloride
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTAL GROWTH;
DENSITY (SPECIFIC GRAVITY);
ETCHING;
OPTICAL MICROSCOPY;
SILICON;
SODIUM CHLORIDE;
SURFACE STRUCTURE;
WET CHEMICAL ETCHING;
CRYSTAL STRUCTURE;
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EID: 0036131702
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(01)01740-7 Document Type: Article |
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Times cited : (11)
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References (18)
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