Structure and characterization of magnetoresistance of La0.7Pb0.3MnO3-δ in bulk and films deposited on LaAlO3 (100), (110) and (111) substrates

Materials Letters

Volumn 52, Issue 1-2, 2002, Pages 120-125

  Li, H Q ^a,b   Fang, Q F ^a   Zhu, Z G ^a  

^a INSTITUTE OF SOLID STATE PHYSICS   (China)

^b HEFEI UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

AFM; Magnetoresistance; Phase transition; Semiconductor; Thin film; XRD

Indexed keywords

ATOMIC FORCE MICROSCOPY; COLOSSAL MAGNETORESISTANCE; MAGNETRON SPUTTERING; MOLECULAR ORIENTATION; MOLECULAR STRUCTURE; PHASE TRANSITIONS; SEMICONDUCTING FILMS; SPUTTER DEPOSITION; TRANSPORT PROPERTIES; X RAY DIFFRACTION ANALYSIS;

FILM DEPOSITION;

LANTHANUM COMPOUNDS;

EID: 0036129539     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-577X(01)00378-0     Document Type: Article

References (13)