Dynamic modeling of degradation data

Proceedings of the Annual Reliability and Maintainability Symposium

Volumn , Issue , 2002, Pages 607-611

  Jiang, Mingxiao ^a   Zhang, Yongcang ^a  

^a GE GLOBAL RESEARCH   (United States)

Author keywords

Degradation data; Markov process; Stochastic averaging; Total probability theorem

Indexed keywords

DATA STRUCTURES; DYNAMIC PROGRAMMING; FAILURE ANALYSIS; MATHEMATICAL MODELS; RANDOM PROCESSES;

ACCELERATED LIFE TESTING; DEGRADATION DATA; DYNAMIC MODELING; FAILURE TIME DATA;

RELIABILITY;

EID: 0036127467     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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