Sequential leaching of trace elements in fine-particle aerosol samples on Teflon filters

X-Ray Spectrometry

Volumn 31, Issue 1, 2002, Pages 27-34

  Moloi, K ^a,b   Viksna, A ^a,c   Selin Lindgren, E ^a   Standzenieks, P ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^b UNIVERSITY OF BOTSWANA   (Botswana)

^c UNIVERSITY OF LATVIA   (Latvia)

Author keywords

[No Author keywords available]

Indexed keywords

AEROSOLS; BANDPASS FILTERS; BROMINE COMPOUNDS; ENERGY DISPERSIVE SPECTROSCOPY; LEAD COMPOUNDS; RISK ASSESSMENT; SILICATES; TRACE ELEMENTS;

AEROSOL SAMPLES; AIRBORNE PARTICLE; ELEMENT ANALYZES; ELEMENT CONTENTS; FINE-PARTICLES; FRACTION BOUND; PARTICLE FRACTION; TEFLON FILTERS; TRACES ELEMENTS; TRADITIONAL ELEMENTS;

LEACHING;

EID: 0036112939     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.527     Document Type: Article

References (27)

1. Hlavay J, Polyak K, Molnar A, Meszaros E. Analyst 1998; 123: 859.
2. Loomis D. Epidemiology 2000; 11: 2.
3. Horvath H. Influence of atmospheric aerosols upon the global radiation balance. In Atmospheric Particles, Harrison RM, van Grieken R (eds). Wiley: Chichester, 1998; 543-596.
4. Ure AM. Sci. Total Environ. 1996; 178; 3.
5. Albores AF, Cid BP, Gomez EF, Lopez, EF. Analyst 2000; 125: 1353.
6. Alvarez MB, Malla M, Batistoni DA. Fresenius' J. Anal. Chem. 2001; 369: 81.
7. Szakova J, Tlustoš P, Balik J, Pavlikova D, Vanek V. Fresenuis' J. Anal. Chem. 1999; 363: 594.
8. Ure AM. Mikrochim. Acta 1991; II: 49.
9. Varga I, von Bohlen A, Záray G, Klockenkämper R. J. Trace Microprobe Tech. 2000; 18: 293.
10. Tessier A, Campbell PGC, Bisson M. Anal. Chem. 1979; 51: 884.
11. Liu X, Hopke PK, Cohen D, Bailey G. Sci. Total Environ. 1995; 175: 65.
12. Standzenieks P, Selin E. Nucl. Instrum. Methods 1979; 165: 63.
13. Selin E, Öblad M, Standzenieks P, Boman. J. X-Ray Spectrom. 1991; 20: 325.
14. Öblad M, Standzenieks P, Selin E, Dubois J. Phys. Scr. 1982; 26: 257.
15. Bernasconi G, Tajani A. QXAS, Quantitative X-Ray System, Documentation Version 1.2. IAEA, 1996; 328 pp.
16. Van Espen P, Janssens K, Nobels J. Chemom. Intell. Lab. Syst. 1986; 1: 109.
17. Pettersson RP, Wobrauschek P. Nucl. Instrum. Methods Phys. Res. A 1995; 335: 665.
18. Pettersson RP, Boman J. Nucl. Instrum. Methods Phys. Res. A 1996; 371: 553.
19. Calvet R, Bourgeois S, Msaky JJ. Int. J. Environ. Anal. Chem. 1990; 39: 31.
20. Davidson CM, Ferreira PCS, Ure AM. Fresenius' J. Anal. Chem. 1999; 363: 446.
21. Sager M. Accred. Qual. Assur. 1999; 4: 244.
22. Zvang M, Alva AK, Li YC, Calvert DV. Soil Sci. 1997; 162: 181.
23. Tokalioglu S, Kartal S, Elci L. Anal. Chim. Acta 2000; 413: 33.
24. Gomez Ariza JL, Giraldez I, Sanchez-Rodas D, Morales E. Anal. Chim. Acta 2000; 413: 33.
25. Tack FM, Verloo MC. Total Environ. 1996; 178: 24.
26. Chimidza S, Moloi K. J. Geophys. Res. 2000; 105: 17-811.
27. Öblad M, Selin E. Phys. Scr. 1985; 32: 462.