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Volumn 114, Issue 791, 2002, Pages 98-111
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Advanced exposure-time calculations: Undersampling, dithering, cosmic rays, astrometry, and ellipticities
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0036108643
PISSN: 00046280
EISSN: None
Source Type: Journal
DOI: 10.1086/337997 Document Type: Article |
Times cited : (35)
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References (17)
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