Effects of e-beam mail sanitizing process on commercial electronics

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2002, Pages 376-

  Sexton, Fred W ^a   Dodd, Paul E ^a   Shaneyfelt, Marty R ^a   Schwank, Jim R ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DOSIMETRY; ELECTRON BEAMS; ELECTRONIC EQUIPMENT; IONIZING RADIATION; SECURITY SYSTEMS;

MAIL SANITIZING PROCESS;

MAIL HANDLING;

EID: 0036089640     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)