ABC modeling: Advanced features

IEEE International Symposium on Semiconductor Manufacturing Conference, Proceedings

Volumn , Issue , 2002, Pages 336-339

  Miraglia, Stephanie ^a   Blouin, Cathy ^a   Boldman, Gary ^a   Judd, Shauna ^a   Richardson, Thomas ^a   Yao, David ^a  

^a IBM MICROELECTRONICS   (United States)

Author keywords

ABC; COO; Cost model; Historical model; Idle time; Product cost

Indexed keywords

DEPOSITION; INVESTMENTS; SEMICONDUCTOR DEVICE MANUFACTURE; SILICON WAFERS;

ACTIVITY-BASED COSTING; COST-OF-OWNERSHIP;

COST BENEFIT ANALYSIS;

EID: 0036072949     PISSN: 1523553X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (1)

1. Beyond cost-of-ownership: A causal methodology for costing wafer processing