Accuracy limitations of perfectly matched layers in 3D finite-difference frequency-domain method

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 2002, Pages 1885-1888

  Tischler, Thorsten ^a   Heinrich, Wolfgang ^a  

^a LEIBNIZ INSTITUT FÜR HÖCHSTFREQUENZTECHNIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; FINITE DIFFERENCE METHOD; FREQUENCY DOMAIN ANALYSIS; MAXWELL EQUATIONS; SCATTERING PARAMETERS; THREE DIMENSIONAL; TIME DOMAIN ANALYSIS;

FINITE DIFFERENCE FREQUENCY DOMAIN METHOD; PERFECTLY MATCHED LAYERS; RESIDUAL REFLECTION ERROR; X;

MICROWAVE DEVICES;

EID: 0036070247     PISSN: 0149645X     EISSN: None     Source Type: Journal    
DOI: 10.1109/MWSYM.2002.1012231     Document Type: Article

References (6)

1. A perfectly matched layer for the absorption of electromagnetic waves
2. A perfectly matched anisotropic absorber for use as an absorbing boundary condition
3. Frequency dependence of the constitutive parameters of causal perfectly matched anisotropic absorbers
4. An anisotropic perfectly matched layer-absorbing medium for the truncation of FDTD lattices
5. On the accuracy of perfectly matched layers using a finite element formulation
6. Optimized PML for wave-structure interaction problems