A systematic approach to a reliable neural model for pHEMT using different numbers of training data

IEEE MTT-S International Microwave Symposium Digest

Volumn 2, Issue , 2002, Pages 1105-1108

  Joodaki, Mojtaba ^a   Kompa, Günter ^a  

^a UNIVERSITY OF KASSEL   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ERRORS; HIGH ELECTRON MOBILITY TRANSISTORS; MATHEMATICAL MODELS; MICROWAVE CIRCUITS; NEURAL NETWORKS; OPTIMIZATION; RELIABILITY THEORY;

MAXIMUM SMOOTHNESS; MULTILAYER CIRCUITS; TRAINING ERROR;

MICROWAVE DEVICES;

EID: 0036070024     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. EM-ANN models for microstrip vias and interconnects in multilayer circuits
2. A neural network approach to the modeling of heterojunction bipolar transistors from S-parameter data
3. Constructing a reliable neural network model for a plasma etching process using limited experimental process