A study of the effect of envelope impedance on intermodulation asymmetry using a two-tone time domain measurement system

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 2002, Pages 1841-1844

  Williams, David J ^a   Leckey, Jonathan ^b   Tasker, Paul J ^a  

^a CARDIFF UNIVERSITY   (United Kingdom)

^b Celeritek UK Ltd   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODE RAY OSCILLOSCOPES; COMPUTER SIMULATION; ELECTRIC CURRENT MEASUREMENT; ELECTRIC IMPEDANCE; ELECTRIC WAVEFORMS; ERROR CORRECTION; HETEROJUNCTION BIPOLAR TRANSISTORS; INTERMODULATION; PHASE MEASUREMENT; TIME DOMAIN ANALYSIS; VOLTAGE MEASUREMENT;

ENVELOPE IMPEDANCE EFFECT; INTERMODULATION COMPONENTS; LOAD PULL MEASUREMENT SYSTEMS; MICROWAVE TRANSISTOR ANALYSER; TWO TONE MEASUREMENT SYSTEMS;

ELECTRIC FREQUENCY MEASUREMENT;

EID: 0036068440     PISSN: 0149645X     EISSN: None     Source Type: Journal    
DOI: 10.1109/MWSYM.2002.1012221     Document Type: Article

References (10)

1. High-power time-domain measurement system with active harmonic load-pull for high-efficiency base-station amplifier design
2. Two-tone IMD asymmetry in microwave power amplifiers
3. A novel envelope-termination load-pull method for ACPR optimization of RF/microwave power amplifiers
4. A vector corrected high power on-wafer measurement system with a frequency range for the higher harmonics up to 40 GHz
5. An automated active source and load pull measurement system
6. The effect of a variation in tone spacing on the intermodulation performance of class A and class AB HBT power amplifiers
7. Intermodulation in heterojunction bipolar transistors
8. RF power amplifier design for wireless communications
9. The microwave transition analyser: Measure 25 ps transitions in switched and pulsed microwave components