Comparison of resistance standards between the National Institute of Metrology (China) and the Electrotechnical Laboratory (Japan)

Metrologia

Volumn 39, Issue 2, 2002, Pages 207-212

  Nakanishi, M ^a   Kinoshita, J ^a   Endo, T ^a   Zhang, Z ^a   Shao, H ^a   He, Q ^a   Liang, B ^a  

^a ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATMOSPHERIC HUMIDITY; CODES (STANDARDS); CRYOGENICS; ELECTRIC POTENTIAL; ELECTRIC WIRE; FLUXES; HALL EFFECT; INTERPOLATION; QUANTUM THEORY; RESEARCH LABORATORIES;

CRYOGENIC CURRENT COMPARATORS (CCC);

RESISTORS;

EID: 0036067172     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/39/2/8     Document Type: Article

References (4)