FEM-based reduced-order model for steady-state skin-effect analysis in lossy lines

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 2002, Pages 2025-2028

  Bertazzi, Francesco ^a   Carbonera, Francesco ^a   Goano, Michele ^a   Ghione, Giovanni ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

Coplanar waveguides; Model reduction; Skin effect

Indexed keywords

DIELECTRIC MATERIALS; DIELECTRIC WAVEGUIDES; EDDY CURRENTS; ELECTRODES; ELECTROMAGNETIC FIELDS; ELECTROMAGNETIC WAVE PROPAGATION; FINITE ELEMENT METHOD; FUNCTIONS; INTEGRODIFFERENTIAL EQUATIONS; PERMITTIVITY; SKIN EFFECT; SUBSTRATES;

FREQUENCY DEPENDENT CHARACTERISTIC PARAMETERS; LOSSY TRANSMISSION LINES; PROBLEM MATCHED BASIS FUNCTIONS; QUASI STATIC FINITE ELEMENT TECHNIQUE; REDUCED ORDER MODEL; SINGULAR VALUE DECOMPOSITION; STEADY STATE SKIN EFFECT ANALYSIS; SUPERPOSITION APPROACH;

MICROWAVE INTEGRATED CIRCUITS;

EID: 0036066858     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)

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7. Problem-matched basis functions for moment method analysis-An application to reflection gratings
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