Structure, odd lines and topological entropy of disorder of amorphous silicon

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 58, Issue 4, 2002, Pages 346-351

  Wooten, Frederick ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ALGORITHM; ARTICLE; CHEMICAL STRUCTURE; ENTROPY; MATHEMATICAL ANALYSIS; STRUCTURE ANALYSIS;

EID: 0036066637     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108767302006669     Document Type: Article

References (8)