THz techniques in plasma diagnostics

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 2002, Pages 1587-1590

  Deng, B H ^a   Domier, C W ^a   Donne A J H ^a   Lee, K C ^a   Luhmann Jr , N C ^a   Mazzucato, E ^a   Munsat, T ^a   Park, H ^a   Van De Pol, M ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; ELECTRON CYCLOTRON RESONANCE; ELECTRON SCATTERING; INTERFEROMETRY; MAGNETIC FIELD EFFECTS; MAGNETOPLASMA; PLASMA DENSITY; POLARIMETERS;

ELECTRON CYCLOTRON EMISSION IMAGING; ELECTRON TEMPERATURE; IMAGING REFLECTOMETRY; INFRARED INTERFEROMETRY;

PLASMA DIAGNOSTICS;

EID: 0036063369     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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