Comparison of fault detection techniques: Problem and solution

Proceedings of the American Control Conference

Volumn 6, Issue , 2002, Pages 4513-4518

  Lou, S J ^a   Budman, H ^a   Duever, T A ^a  

^a UNIVERSITY OF WATERLOO   (Canada)

Author keywords

Comparison; Haar Wave Net; Pattern classification; Projection pursuit regression

Indexed keywords

FAULT DETECTION TECHNIQUES; HAAR WAVE NET; PROJECTION PURSUIT REGRESSION;

ALGORITHMS; EXTRAPOLATION; NEURAL NETWORKS; REGRESSION ANALYSIS; WAVELET TRANSFORMS;

PATTERN RECOGNITION;

EID: 0036056486     PISSN: 07431619     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ACC.2002.1025361     Document Type: Conference Paper

References (5)

1. WaveNet: A multiresolution hierarchical neural network with localized learning
2. Regression modeling in back-propagation and projection pursuit learning
3. Radial basis function networks for classifying process faults
4. Connections between neural networks and multivariate statistical methods: An overview