35nm CMOS FinFETs

IEEE Symposium on VLSI Circuits, Digest of Technical Papers

Volumn , Issue , 2002, Pages 104-105

  Yang, Fu Liang ^a   Chen, Haur Ywh ^a   Chen, Fang Cheng ^a   Chan, Yi Lin ^a   Yang, Kuo Nan ^a   Chen, Chih Jian ^a   Tao, Hun Jan ^a   Choi, Yang Kyu ^a   Liang, Mong Song ^a   Hu, Chenming ^a  

^a TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENTS; ELECTRIC RESISTANCE; HOT CARRIERS; SEMICONDUCTOR DEVICE STRUCTURES; SILICON ON INSULATOR TECHNOLOGY; SILICON WAFERS;

PARASITIC RESISTANCE;

FIELD EFFECT TRANSISTORS;

EID: 0036053770     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)