Statistical characterization of a measurement approach using MCMC

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 2, Issue , 2002, Pages 1373-1376

  Baili, H ^a   Fleury, G ^a  

^a SUPELEC   (France)

Author keywords

Indirect measurement; Knowledge based models; MCMC; Stochastic calculus; Uncertainty

Indexed keywords

DIFFERENTIAL EQUATIONS; ESTIMATION; KNOWLEDGE BASED SYSTEMS; MARKOV PROCESSES; MATHEMATICAL MODELS; MONTE CARLO METHODS; PROBABILITY DENSITY FUNCTION; PROBABILITY DISTRIBUTIONS; UNCERTAIN SYSTEMS;

DYNAMIC CONTINUOUS MEASUREMENT; INDIRECT MEASUREMENT; KNOWLEDGE BASED MODELS; STOCHASTIC CALCULUS;

MEASUREMENT THEORY;

EID: 0036052658     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

1. Statistical characterization of a measurement within a dynamical system
2. Caractérisation statistique d'une mesure issue d'un système dynamique, application à la thermique
3. Cractérisation statistique de mesures dynamiques continues à partir d'un modèle de connaissance
4. Probabilistic approach using MCMC for indirect measurement problems in knowledge-based models, applications from thermophysics and biology
5. Understanding the Metropolis-Hastings algorithm