High throughput characterization of magnetic semiconductor thin films with a scanning SQUID microscope

Materials Research Society Symposium - Proceedings

Volumn 700, Issue , 2002, Pages 55-60

  Fan, X J ^a   Murakami, M ^a   Takahasi, R ^a   Koida, T ^a   Matsumoto, Y ^a   Hasegawa, T ^a   Fukumura, T ^a   Kawasaki, M ^a   Ahmet, P ^a   Chikyow, T ^a   Koinuma, H ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; MAGNETIC DOMAINS; MAGNETIZATION; SEMICONDUCTING FILMS; SQUIDS; SURFACES; THIN FILMS;

COMBINATORIAL COMPOSITION; MAGNETIC MOMENT; MAGNETIC SEMICONDUCTOR THIN FILMS; RUTILE;

MAGNETIC SEMICONDUCTORS;

EID: 0036051196     PISSN: 02729172     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (3)