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Volumn , Issue , 2002, Pages 373-376
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Reliability of InP-based avalanche photodiodes for high bit-rate fiber-optic communication systems
a a a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
BIT ERROR RATE;
CURRENT VOLTAGE CHARACTERISTICS;
FIBER OPTIC NETWORKS;
RELAXATION PROCESSES;
SEMICONDUCTING INDIUM PHOSPHIDE;
STRAIN;
STRESSES;
MECHANICAL STRESSES;
PHOTODIODES;
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EID: 0036049065
PISSN: 10928669
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (7)
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References (7)
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