Two-dimensional spectral analysis for marked point processes

Biometrical Journal

Volumn 44, Issue 6, 2002, Pages 718-745

  Renshaw, Eric ^a  

^a UNIVERSITY OF STRATHCLYDE   (United Kingdom)

Author keywords

Anisotropy; Cartesian and polar spectra; Clumping; Competition; Inhibition; Lattice spectra; Longleaf pine; Point and mark spectra; Scales of pattern; Second order moment functions; Spatial analysis

Indexed keywords

CARTESIAN AND POLAR SPECTRUM; CARTESIANS; CLUMPING; INHIBITION; LATTICE SPECTRUM; LONGLEAF PINE; MOMENT FUNCTIONS; POINT AND MARK SPECTRUM; SCALE OF PATTERN; SECOND ORDER MOMENT; SECOND-ORDER MOMENT FUNCTION; SPATIAL ANALYSIS; SPECTRA'S;

SPECTRUM ANALYSIS;

EID: 0036041828     PISSN: 03233847     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-4036(200209)44:6<718::AID-BIMJ718>3.0.CO;2-6     Document Type: Article

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