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Volumn 26, Issue 5, 2002, Pages 341-347
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Dispersion analysis of SnS and SnSe
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Author keywords
Dispersion analysis; IV VI semiconductors; Optical constant
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Indexed keywords
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EID: 0036040825
PISSN: 13000101
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (37)
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References (27)
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