Surface analysis of polymers electrically improved by plasma-source ion-implantation

Analytical and Bioanalytical Chemistry

Volumn 373, Issue 7, 2002, Pages 595-600

  Lee, Yeonhee ^a   Han, Seunghee ^a   Lim, Hyuneui ^a   Kim, Youngwoo ^a   Kim, Haidong ^a  

^a Korea Institute of Science and Technology   (South Korea)

Author keywords

Plasma source ion implantation; Polymer modification; Surface analysis; TOF SIMS; XPS

Indexed keywords

GRAPHITE; IONS; POLYMERS;

SURFACE ANALYSIS;

CHEMICAL ANALYSIS;

ARGON; CARBON; GRAPHITE; INERT GAS; NITROGEN; OXYGEN; POLYMER; XENON;

ANALYTICAL EQUIPMENT; ARTICLE; CHEMICAL BOND; CROSS LINKING; ELECTRICAL PARAMETERS; FILM; MOLECULAR DYNAMICS; SURFACE CHARGE; SURFACE PROPERTY;

EID: 0036040751     PISSN: 16182642     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00216-002-1374-z     Document Type: Article

References (18)